Nothing accelerates a testability engineer's receding hairline as the addition of further clock domains to the latest SoC or IC design. Avoiding clock skew during test is becoming one of the biggest ...
Hierarchical test methodologies are being broadly adopted for large designs. They provide roughly an order of magnitude better ATPG (automatic test program generation) run time, reduce workstation ...
Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
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